Sharp Conductive Diamond Probes
Highly conductive Super Sharp and Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance reflectivity.
Imaging Modes: Contact Mode, Tapping Mode, Amplitude Modulation, Frequency Modulation, True Non-Contact Mode, LFM, Nanomanipulation etc.
Electrical Modes: C-AFM, SCM, PFM, EFM, KPFM, PeakForce-KPFM™, TUNA, PeakForce-TUNA™, SSRM, STM, Lithography, SRM, ResiScope™, Soft-ResiScope™, HD-KFM™ etc.
Nanomechanics Modes: PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation
Standard AFM Cantilever Design
Single Crystal Sharp Diamond Tip
Apex Sharp Tip
Super Sharp Tip
| Model Number |
Length ± 10 um |
Width ± 5 um |
Thickness ± 0.5 um |
Frequency (kHz) |
Spring Constant (N/m) |
Tip Radius (nm) |
Price | ||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Min | Nom | Max | Min | Nom | Max | ||||||
| Apex Sharp | |||||||||||
| AD-2.8-AS | 225 | 35 | 1.5 | 50 | 65 | 100 | 1.0 | 2.8 | 6.0 | 10 ± 5 | $200 or €180 |
| AD-40-AS | 225 | 28 | 3.0 | 100 | 180 | 300 | 20 | 40 | 60 | 10 ± 5 | $200 or €180 |
| Super Sharp | |||||||||||
| AD-2.8-SS | 225 | 35 | 1.5 | 50 | 65 | 100 | 1.0 | 2.8 | 6.0 | < 5 | $400 or €360 |
| AD-40-SS | 225 | 28 | 3.0 | 100 | 180 | 300 | 20 | 40 | 60 | < 5 | $400 or €360 |
| Bulk Tip | |
|---|---|
| Tip Shape | 4 Sided Pyramid |
| Height | 12.5 ± 2.5 um |
| Front Angle (FA) | 25 ± 5 degrees |
| Back Angle (SA) | 15 ± 5 degrees |
| Side Angle (SA) | 22.5 ± 5 degrees |
| Tip Setback (TSB) | 15 ± 5 um |
| Diamond Tip | |
|---|---|
| Tip Shape | Cone |
| Radius | 10 ± 5 nm (AS) / < 5 nm (SS) |
| Height | 300 ± 100 nm |
| Tilt Angle | 0 ± 1 degrees |
| Material | Single Crystal Diamond |
| ½ Angle | 15 ± 2 degrees |
Minimum quantity: 5. Volume discounts apply for orders of 20 or more probes.
Super Sharp probes available in limited quantities.
AD-0.5-AS and AD-0.5-SS probes unavailable until further notice
Nanomechanics Probes
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and stainless steel and can image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance reflectivity.
Nanomechanics Modes: PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation, Scratch testing, Tomography
Super Strong Design
Highly Reproducable Tip Geometry
| Model Number |
Length ± 10 um |
Width ± 5 um |
Thickness ± 0.5 um |
Frequency (kHz) |
Spring Constant (N/m) |
Tip Radius (nm) |
Price | ||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Min | Nom | Max | Min | Nom | Max | ||||||
| NM-RC | 125 | 30 | 4.0 | 500 | 750 | 1000 | 100 | 350 | 600 | 10 ± 5 | $450 or €405 |
| NM-RC-C | 125 | 30 | 4.0 | 500 | 750 | 1000 | 100 | 350 | 600 | 10 ± 5 | $500 or €450 |
| NM-TC | 125 | 30 | 4.0 | 500 | 750 | 1000 | 100 | 350 | 600 | 25 ± 10 | $250 or €225 |
| NM-TC-C | 125 | 30 | 4.0 | 500 | 750 | 1000 | 100 | 350 | 600 | 25 ± 10 | $300 or €270 |
| Bulk Tip | |
|---|---|
| Tip Shape | 4 Sided Pyramid |
| Height | 12.5 ± 2.5 um |
| Front Angle (FA) | 25 ± 5 degrees |
| Back Angle (SA) | 15 ± 5 degrees |
| Side Angle (SA) | 22.5 ± 5 degrees |
| Tip Setback (TSB) | 15 ± 5 um |
| Diamond Tip | |
|---|---|
| Tip Shape | Cone |
| Radius | 10 ± 5 nm (RC) / 25 ± 10 nm (TC) |
| Height | 500 ± 100 nm |
| Tilt Angle | 0 ± 1 degrees |
| Material | Diamond |
| ½ Angle | 45 ± 3 deg (RC) / 45 ± 10 deg (TC) |
Each probe model ending in ‐C comes with each cantilever individually characterized including: spring constant, tip radius and a high-resolution SEM image per probe to enable fully quantitative measurements.
Minimum quantity: 5. Volume discounts apply for orders of 20 or more probes.
Cone Probes
The FM-LC and NCH-LC probes are a new cone shaped tip what offers you the advantages of diamond at higher resolution and without the variability in tip shape associated with competing diamond coated products. These probes are ideally suited to long lifetime imaging of low relief samples. They are also conductive with a contact resistance in the 100 kOhm range.
Imaging Modes: Contact Mode, Tapping Mode, Amplitude Modulation, Frequency Modulation, True Non-Contact Mode, LFM, Nanomanipulation etc.
Electrical Modes: C-AFM, SCM, PFM, EFM, KPFM, PeakForce-KPFM™, TUNA, PeakForce-TUNA™, SSRM, STM, Lithography, SRM, ResiScope™, Soft-ResiScope™, HD-KFM™ etc.
| Model Number |
Length ± 10 um |
Width ± 5 um |
Thickness ± 0.5 um |
Frequency (kHz) |
Spring Constant (N/m) |
Tip Radius (nm) |
Price | ||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Min | Nom | Max | Min | Nom | Max | ||||||
| FM-LC | 225 | 48 | 3.5 | 50 | 100 | 150 | 4 | 8 | 16 | 20 ± 10 | $140 or €126 |
| NC-LC | 125 | 32 | 4.5 | 300 | 450 | 600 | 50 | 100 | 200 | 20 ± 10 | $140 or €126 |
| Bulk Tip | |
|---|---|
| Tip Shape | 4 Sided Pyramid |
| Height | 12.5 ± 2.5 um |
| Front Angle (FA) | 25 ± 5 degrees |
| Back Angle (SA) | 15 ± 5 degrees |
| Side Angle (SA) | 22.5 ± 5 degrees |
| Tip Setback (TSB) | 15 ± 5 um |
| Diamond Tip | |
|---|---|
| Tip Shape | Cone |
| Radius | 20 ± 10 nm |
| Height | 175 ± 50 nm |
| Tilt Angle | 0 ± 1 degrees |
| Material | Single Crystal Diamond |
| ½ Angle | 45 ± 3 deg (RC) / 45 ± 10 deg (TC) |
Minimum quantity: 5. Volume discounts apply for orders of 20 or more probes.
Special Development Probes - Nanoindentation
We have developed new short ultra‐high stiffness probes specifically for indenting hard materials such as metals and composites. These probes offer access to 1500 N/m and 3000 N/m spring constants in diamond which give users access to materials in the 100 – 300 GPa range. We have successful indented stainless steel with these probes at depths of 10s of nm and have accurately recovered the modulus using Oliver‐Pharr analysis.
| Model Number |
Length ± 10 um |
Width ± 5 um |
Thickness ± 0.5 um |
Frequency (kHz) |
Spring Constant (N/m) |
Tip Radius (nm) |
Price | ||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Min | Nom | Max | Min | Nom | Max | ||||||
| NMU-BC | 60 | 25 | 7.0 | 3500 | 4000 | 4500 | 2000 | 3000 | 5000 | 10 ± 5 | $1000 or €900 |
| NMU-BC-C | 60 | 25 | 7.0 | 3500 | 4000 | 4500 | 2000 | 3000 | 5000 | 10 ± 5 | $1500 or €1350 |
| Bulk Tip | |
|---|---|
| Tip Shape | 3 Sided Pyramid - Tip View |
| Height | 10 ± 2 um |
| Front Angle (FA) | -- |
| Back Angle (SA) | -- |
| Side Angle (SA) | -- |
| Tip Setback (TSB) | None |
| Diamond Tip | |
|---|---|
| Tip Shape | Cone |
| Radius | 10 ± 5 nm |
| Height | 0.5 ± 0.1 um (RC) 1 ± 0.1 um (BC) |
| Tilt Angle | 0 ± 1 degrees |
| Material | Diamond |
| ½ Angle | 45 ± 3 deg |
Each probe model ending in ‐C is calibration by instrumented nanoindenter.
Minimum quantity: 1. Limited stock.