Sharp Conductive Diamond Probes

Highly conductive Super Sharp and Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance reflectivity.

Imaging Modes: Contact Mode, Tapping Mode, Amplitude Modulation, Frequency Modulation, True Non-Contact Mode, LFM, Nanomanipulation etc.

Electrical Modes: C-AFM, SCM, PFM, EFM, KPFM, PeakForce-KPFM™, TUNA, PeakForce-TUNA™, SSRM, STM, Lithography, SRM, ResiScope™, Soft-ResiScope™, HD-KFM™ etc.

Nanomechanics Modes: PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation

Standard AFM Cantilever Design

Standard AFM Cantilever Design

Single Crystal Sharp Diamond Tip

Single Crystal Sharp Diamond Tip

Apex Sharp Tip

Apex Sharp Tip

Super Sharp Tip

Super Sharp Tip

Model
Number
Length
± 10 um
Width
± 5 um
Thickness
± 0.5 um
Frequency
(kHz)
Spring Constant
(N/m)
Tip Radius
(nm)
Price
Min Nom Max Min Nom Max
Apex Sharp
AD-0.5-AS 225 48 1.0 10 30 50 0.1 30 1.0 10 ± 5 $200 or €180
AD-2.8-AS 225 35 1.5 50 65 100 1.0 2.8 6.0 10 ± 5 $200 or €180
AD-40-AS 225 28 3.0 100 180 300 20 40 60 10 ± 5 $200 or €180
Super Sharp
AD-0.5-SS 225 48 1.0 10 30 50 0.1 30 1.0 10 ± 5 $300 or €270
AD-2.8-SS 225 35 1.5 50 65 100 1.0 2.8 6.0 10 ± 5 $300 or €270
AD-40-SS 225 28 3.0 100 180 300 20 40 60 10 ± 5 $300 or €270

Bulk Tip
Tip Shape 4 Sided Pyramid
Height 12.5 ± 2.5 um
Front Angle (FA) 25 ± 5 degrees
Back Angle (SA) 15 ± 5 degrees
Side Angle (SA) 22.5 ± 5 degrees
Tip Setback (TSB) 15 ± 5 um

Diamond Tip
Tip Shape Cone
Radius 10 ± 5 nm (AS) / < 5 nm (SS)
Height 300 ± 100 nm
Tilt Angle 0 ± 1 degrees
Material Single Crystal Diamond
½ Angle 15 ± 2 degrees

Minimum quantity: 5. Volume discounts apply for orders of 20 or more probes.

AD-0.5-AS and AD-0.5-SS probes unavailable until further notice

 

Nanomechanics Probes

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and stainless steel and can image the indents at high resolution in-situ using the same probe. A gold reflex coating deposited on the detector side of the cantilever to enhance reflectivity.

Nanomechanics Modes: PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation, Scratch testing, Tomography

 
Super Strong Design

Super Strong Design

Highly Reproducable Tip Geometry

Highly Reproducable Tip Geometry

 
Model
Number
Length
± 10 um
Width
± 5 um
Thickness
± 0.5 um
Frequency
(kHz)
Spring Constant
(N/m)
Tip Radius
(nm)
Price
Min Nom Max Min Nom Max
NM-RC 125 30 4.0 500 750 1000 100 350 600 10 ± 5 $450 or €405
NM-RC-C 125 30 4.0 500 750 1000 100 350 600 10 ± 5 $500 or €450
NM-TC 125 30 4.0 500 750 1000 100 350 600 25 ± 10 $250 or €225
NM-TC-C 125 30 4.0 500 750 1000 100 350 600 25 ± 10 $300 or €270
Bulk Tip
Tip Shape 4 Sided Pyramid
Height 12.5 ± 2.5 um
Front Angle (FA) 25 ± 5 degrees
Back Angle (SA) 15 ± 5 degrees
Side Angle (SA) 22.5 ± 5 degrees
Tip Setback (TSB) 15 ± 5 um

Diamond Tip
Tip Shape Cone
Radius 10 ± 5 nm (RC) / 25 ± 10 nm (TC)
Height 500 ± 100 nm
Tilt Angle 0 ± 1 degrees
Material Diamond
½ Angle 45 ± 3 deg (RC) / 45 ± 10 deg (TC)

Each probe model ending in ‐C comes with each cantilever individually characterized including: spring constant, tip radius and a high-resolution SEM image per probe to enable fully quantitative measurements.

Minimum quantity: 5. Volume discounts apply for orders of 20 or more probes.

 

Special Development Probes - Nanoindentation

We have developed new short ultra‐high stiffness probes specifically for indenting hard materials such as metals and composites. These probes offer access to 1500 N/m and 3000 N/m spring constants in diamond which give users access to materials in the 100 – 300 GPa range. We have successful indented stainless steel with these probes at depths of 10s of nm and have accurately recovered the modulus using Oliver‐Pharr analysis.

Model
Number
Length
± 10 um
Width
± 5 um
Thickness
± 0.5 um
Frequency
(kHz)
Spring Constant
(N/m)
Tip Radius
(nm)
Price
Min Nom Max Min Nom Max
NMS-RC 60 25 6.0 2000 2500 3000 1000 1500 2000 10 ± 5 $1000 or €900
NMS-RC-C 60 25 6.0 2000 2500 3000 1000 1500 2000 10 ± 5 $1500 or €1350
NMU-BC 60 25 7.0 3500 4000 4500 2000 3000 5000 10 ± 5 $1000 or €900
NMU-BC-C 60 25 7.0 3500 4000 4500 2000 3000 5000 10 ± 5 $1500 or €1350

Bulk Tip
Tip Shape 3 Sided Pyramid - Tip View
Height 10 ± 2 um
Front Angle (FA) --
Back Angle (SA) --
Side Angle (SA) --
Tip Setback (TSB) None
Diamond Tip
Tip Shape Cone
Radius 10 ± 5 nm
Height 0.5 ± 0.1 um (RC) 1 ± 0.1 um (BC)
Tilt Angle 0 ± 1 degrees
Material Diamond
½ Angle 45 ± 3 deg

Each probe model ending in ‐C is calibration by instrumented nanoindenter.

Minimum quantity: 1. Limited stock.

 

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