Sharp Conductive Single Crystal Diamond Probes

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ depending on contact radius measured on a silver surface. By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

 
AD-0.5

From $200 per probe (5 pack)
Spring Constant: 0.5 N/m
Dimensions: 225 x 50 um
Frequency: 30 kHz

AD-2.8

From $200 per probe (5 pack)
Spring Constant: 2.8 N/m
Dimensions: 225 x 35 um
Frequency: 65 kHz

AD-40

From $200 per probe (5 pack)
Spring Constant: 40 N/m
Dimensions: 225 x 28 um
Frequency: 180 kHz

 

Imaging Modes:

Contact Mode, Tapping Mode, Amplitude Modulation, Frequency Modulation, True Non-Contact Mode, LFM, Nanomanipulation etc.

Electrical Modes:

C-AFM, SCM, PFM, EFM, KPFM, PeakForce-KPFM™, TUNA, PeakForce-TUNA™, SSRM, STM, Lithography, SRM, ResiScope™, Soft-ResiScope™, HD-KFM™ etc.

Nanomechanics Modes:

PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation


Nanomechanics Probe

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

 

 
AD-150-NM

From $500 per probe (5 pack)
Spring Constant: 150 N/m
Dimensions: 125 x 30 um
Frequency: 500 kHz

 

Nanomechanics Modes:

PeakForce-QNM™, AMFM Mode, Contact Resonance, QI™ Mode, PinPoint™ Nanomechanical Mode, HybriD Mode™, Nanoindentation, Scratch testing, Tomography


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