Sharp single crystal diamond AFM probes

Utilizing the latest in advanced manufacturing capability. Our innovative and unique technology is a simple and efficient method to create bespoke micro- and nanoscale shapes and profiles in diamond and other hard carbon based materials. The repeatability and accuracy of the technique allows for precision engineering in desired locations.

“I have been very impressed with Adama Innovations diamond probes, especially in terms of stability. I have been able to image overnight without needing to change tips. For electrical applications they are a lot more reliable than the coated tips. Not having to change the tip because it is blunt makes a huge difference to productivity.”

— Dr. Jonathan Moffat, Applications Scientist, Asylum Research
“Adama Innovation probes work very well for Electrochemical strain microscopy (ESM) with good spatial resolution, a stable electromechanical signal and no observable tip degradation. Measurements could be performed easily with small AC voltages and amplitude down to 5 pm whist other tips we tried required higher voltages and still often had worse performance.”

— Dr. Stephan Bradler, Formerly University of Marburg, Germany
“I have tested the probes in our system and obtained quite amazing results. In general, Adama’s probes are well suited for our current-controlled SPL, which allows sub-40nm resolution and reliable performance with low wear even after 2-3 days (more than 30 lithography scans with one probe).”

— Dr.Peng Li, Assistant Professor, NCNST, Beijing, P.R. China.

Wafer Scale Production Using
State of the Art Fabrication Techniques

Based on Standard Silicon Cantilevers Compatible with All Models of AFM


Single Crystal Diamond Tips
For Ultimate Strength and Resolution