Sharp single crystal diamond AFM probes
Resolution | Lifetime | Conductivity
Diamond Tips with versatile geometries
Cantilever spring constants from 1 - 10,000 N/m
Scanning Probe solutions for many applications
Utilizing the latest in advanced manufacturing capability, our innovative technology is a robust and efficient method to create bespoke micro- and nanoscale shapes and profiles in diamond and other hard carbon based materials. The repeatability and accuracy of the technique allows for precision engineering in desired locations, including the formation of our tip radii down below 5 nanometres.
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Voice Of Customer
““I have been very impressed with Adama Innovations diamond probes, especially in terms of stability. I have been able to image overnight without needing to change tips. For electrical applications they are a lot more reliable than the coated tips. Not having to change the tip because it is blunt makes a huge difference to productivity.”
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““Adama Innovation probes work very well for Electrochemical strain microscopy (ESM) with good spatial resolution, a stable electromechanical signal and no observable tip degradation. Measurements could be performed easily with small AC voltages and amplitude down to 5 pm whist other tips we tried required higher voltages and still often had worse performance.”
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““I have tested the probes in our system and obtained quite amazing results. In general, Adama’s probes are well suited for our current-controlled SPL, which allows sub-40nm resolution and reliable performance with low wear even after 2-3 days (more than 30 lithography scans with one probe).”
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Tech Bite
Based on Standard Silicon Cantilevers Compatible with All Models of AFM
Wafer Scale Production Using State of the Art Fabrication Techniques
Single Crystal Diamond Tips For Ultimate Strength and Resolution